Ion-tof公司

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August undefined, 2024

Web25 mei 2024 · IONTOF GmbH Heisenbergstr.15 48149 Münster Germany www.iontof.com Registergericht: Amtsgericht Münster, HRB 10680 Geschäftsführer: Dr. Ewald Niehuis … WebToF-SIMS is an imaging mass spectrometry (MS) technique that allows us to obtain isotopic, elemental, and molecular information from the surface of solid samples. A pulsed, …

关于我们-飞行时间二次离子质谱 (TOF-SIMS) 德国IONTOF

WebThe positive and negative spectra for each sample were acquired using TOF-SIMS.5 (ION-TOF GmbH, Münster) with 60 keV Bi 3 2+, current of 0.2 pA, as a primary ion beam and a 10 keV Ar 1000 +, current of 2 nA, as a sputtering beam. 16 The analysis area was 100 × 100 μm 2, with a pixel density of 128 × 128, and the sputtering area was 500 × ... WebOur Time Of Flight (TOF) mass spectrometer components are designed to generate, store, separate and detect ions. They are designed to be used as components in specialized … img burning download

PHI nanoTOF II TOF-SIMS Surface Analysis Instrument

Web我司作为德国ion-tof公司的中国总代理，成立于2012年。主要负责中国大陆及港澳地区的销售、售后、宣传、技术培训等工作。公司成员来自北京大学、中科院物理所等一流院校 … WebIONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Web22 dec. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company for products for surface analysis, surface spectrometry, surface imaging, depth profiling, retrospective analysis and 3D analysis imgburning free

Interpretation of TOF‐SIMS data based on information entropy of spectra ...

Web25 mei 2024 · IONTOF GmbH 626 followers on LinkedIn. Advanced Ion Beam Technology for Surface Analysis. Innovative Ion Beam Technology for Surface Analysis IONTOF is a manufacturer of innovative instruments ... Web• TOF-SIMS: “ION-TOF IV” instrument. Ga-LMIS analytical source, 25 keV, high current bunched mode (typically m/∆m = 8000), analysis area 60×60 µm2. Sputter source Ar-EI, 3 keV, sputter area 200×200 µm2. Pulsed electron source for neutralisa-tion, 4×10–6 mbar argon flooding for sensitivity enhancement. imgburn ita downloadWebThe ioniTOF mass analyzer is designed as a modular and flexible TOF-MS platform that allows you to choose the mass resolving power you need and also upgrade to higher resolution if you feel the need at a later stage of your experiments. The ioniTOF is available with mass resolutions ranging from 500 to even more than 10,000. imgburn iso dvd

"Web3 jul. 2012 · 北京艾飞拓科技有限公司作为德国ION-TOF公司的中国总代理，成立于2012年。. 公司成员来自北京大学、中科院物理所等一流院校研究生。. 主要负责中国大陆及港澳地区的销售、售后、宣传、技术培训等工作。. “以物理学、材料学、国际贸易等专业背景打造的 ... " - Ion-tof公司

Ion-tof公司

http://www.iontof.com.cn/bk_22421317.html

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Web德国ion tof公司是目前国际tof-sims仪器主要生产商。 2003年，德国ion tof公司研发了第五代tof-sims仪器。 2005年，德国ion tof公司推出第一代bi源。 2010年，德国ion tof公司 … WebAn ion source (either pulsed or continuous) is used for lab-related TOF experiments, but not needed for TOF analyzers used in space, where the sun or planetary ionospheres …

WebIONTOF GmbH Heisenbergstr.15 48149 Münster Germany www.iontof.com Registergericht: Amtsgericht Münster, HRB 10680 Geschäftsführer: Dr. Ewald Niehuis Website … WebION-TOF公司创建于1989年，是专门研究和生产飞行时间二次离子质谱仪器(TOF-SIMS)的高科技公司。其创始人贝宁豪文(Beninghoven)教授是静态二次离子质谱的奠基人，创建 …

Web北京艾飞拓科技有限公司作为德国ION-TOF公司的中国总代理，成立于2012年。公司成员来自北京大学、中科院物理所等一流院校研究生。主要负责中国大陆及港澳地区的销售、 … Web19 jan. 2024 · Specifically with a huge cluster ion beam such as Ar cluster ions, TOF-SIMS provides organic depth profiles in detail, which is powerful not only for organic and polymer science fields but also for biological fields. However, secondary ionization by TOF-SIMS is often a problem in quantitative analysis due to the matrix effects 1–14 1. R. G.

Web24 mrt. 2024 · Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a sensitive surface analytical technology, which can simultaneously acquire diverse chemical components and their precise locations on the surfaces of samples without any requirements for chemical damage pretreatments or additional matrices. Commonly, the …

Web为了进一步简化谱图数据处理，IONTOF 为 M6 提供了各种工具，例如质谱图库，完全集成的多元统计分析（MVSA）软件包，以及强大性能的 Q ExactiveTM 功能扩展。 M6 TOF … imgburn le crabe infoWebIONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry) - LEIS (low energy ion scattering). Ion beam technology products for surface spectrometry, surface analysis, depth profiling, surface imaging, 3D analysis, … imgburn instructionsWeb3 jul. 2012 · 艾飞拓公司简介. 北京艾飞拓科技有限公司作为德国ION-TOF公司的中国总代理，成立于2012年。. 公司成员来自北京大学、中科院物理所等一流院校研究生。. 主要负 … imgburn iso dvd 書き込みWeb13 apr. 2024 · 南京某科技公司将Vzense RGB-D ToF相机集成在军事考核评分系统中，用于检测士兵体能达标状况。应用案例六. 牛羊数量检测. Vzense ToF相机在畜牧业养殖方 … imgburn libdvdcssWebThe TOF.SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF Company. Its design guarantees optimum performance in all fields of SIMS applications. The instruments offers three ion sources offering Bi1–7+, Cs+ and O2+ and is equipped with a reflectron TOF analyzer giving high secondary ion transmission with ... imgburn free download win 10Web2.3. ToF-SIMS 和Rf-GDOES深度剖析 ToF-SIMS 和Rf-GDOES 设备分别是德国ION-ToF 公司的ION-ToF SIMS 5和法国Horiba 公司的 GD-Profiler2。ToF-SIMS 深度剖析的工作参数为：2keV O 2 +溅射离子，30keVBi+为二次离子源，束流强 imgburn latest versionWebTime-of-Flight Secondary Ion Mass Spectrometry Summary Time-of-flight secondary ion mass spectrometry (ToF-SIMS) employs a pulsed primary ion beam and a time-of-flight mass analyzer for the detection of molecular ions with mass-to-charge ratios ranging from m/z 1 to m/z 10,000 in a single spectrum. imgburn iso 書き込み